PIXE 2010
12th INTERNATIONAL CONFERENCE ON
 PARTICLE INDUCED X-RAY EMISSION
AND ITS ANALYTICAL APPLICATIONS
27th June to 2nd July 2010
 Topics covered in the conference

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  • Fundamental processes of ionisation, X-ray emission and absorption

  • Fundamental parameters

  • PIXE software

  • PIXE methodology and facilities

  • PIXE of complex and layered samples (mapping, depth profiling)

  • Atmospheric aerosols

  • Environmental and earth sciences

  • Extra-terrestrial applications

  • Biology and medicine

  • Forensic science

  • Archaeometry and Cultural Heritage

  • Materials Science